Defect localisation
Pixel-level localisation of manufacturing defects.
Result
| split | pixel AP |
|---|---|
| train | 0.9839 |
| val | 0.9565 |
| test | 0.9583 |
The finding
Notes
- Trained from scratch for 120 epochs across 12 MVTec AD object categories. - Test pixel AP 0.9583, pooled IoU 0.8033, per-image IoU 0.6232. The decision threshold was tuned on the validation split.
Figures
Elsewhere
Code and full results on GitHub
Every number is read from the file the run produced. github.com/hammasbuilds · kaggle.com/muhammadhammas13